Laizhou Lyric Testing Equipment Co., Ltd.

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MODEL HARTIP 3210 LEEB HARDNESS TESTER

 

        HARTIP 3210 is a new generation of Leeb hardness tester with more advanced technology and features. The tester applies our new patent dual-coil sensor technology which makes the tester more accurate than old previous model. All impact devices (probes) are no need to setup impact direction. HARTIP 3210 can work with both analogy impact device and wireless RF probe. The measuring values can be downloaded to PC and printer by wireless or by cable. The HARTIP 3210 also can be powered by USB power supply without battery via PC cable. 

 

Features

  • Wireless digital / cable analogue compatible

  • No need to set up different impact direction.

  • Higher accuracy with dual-coil technology

  • TFT large color LCD with pixel 320 x 240.

  • Multi color style, suitable for using under sunshine

  • Multi display modes - statistics, bar graph, etc.

  • Multi save mode for data.

  • Multi statistics calculation

  • Print online and screen copy printout

  • Sound reminder, real date and time

  • Recalibration for unified or individual scale

  • Operator, part No., procedure No. record

 

Main parameters

 

Model HARTIP 3210

Accuracy

±0.3% @ HL=800, Repeatability: ±2HL

Principle

Leeb hardness measurement

Display

2.8” 320 x 240 TFT color LCD - fittable under sunshine

Hardness scale

HL / HRC / HRB / HB / HV / HS / HRA /σb

Measuring range

HL170-960 / HRC1.3-78.2 / HRB1.2-139.7 / HB28-1027 / HV45-1221 / HS4.0-112.1 / HRA1.3-88.5 / σb(rm)118- 3315N/mm2

Impact device

r/f wireless probe D / standard cable probe D

DC / D+15 / C / G / E / DL (Optional)

r/f communication distance

10m in space

r/f frequency

2.4GHz

Impact direction

Universal angle type

Materials and curves

11 common metal materials, 60 conversion curves

Memory

25000 data

Statistics

Single group analysis -- mean, max., min., extreme deviation, standard deviation, coefficient of kurtosis, coef­ficient of skewness, percent of pass, column diagram, normality distribution test and uniform distribution test

Double group analysis -- significant difference test for mean value, standard deviation, percent of pass and distribution

Re-calibration

Calibration for unified or individual scale

Indicator

Upper limit / Lower limit / low battery / buzzer warning / date and time

Communication interface

2.4G wireless / USB / RS232 / Bluetooth (optional)

Continuous working time

>40 hours

Power supply

1.5V AA alkaline battery x 4 / 1.2V nickel-hydrogen rechargeable battery x 4 / 3.7V Li-ion rechargeable bat­tery x 4 / USB power supply

Working environment

-10ºC~+45ºC

Dimension (mm)

195 x 84 x 38

Net weight (g)

550

Standards

Conforming to ASTM A956, DIN 50156, GB/T 17394-1998

 

Standard package

 

HARTIP 3210 main unit 1

Impact device D (cable or RF) 1

Test block D 1

Small support ring 1

Cleaning brush 1

USB dongle 1

PC software 1

Operation manual 1

Test certificate 1

Carrying case 1

 

Optional accessories

 

Cable probe D/DC/D+15/C/G/E/DL

RF Wireless probe D/DC/D+15/C/E/DL

Wireless micro printer

Standard block G

Special support rings

USB charging cable

USB charger

Leather case

 

 

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